Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2007/10/01
Vol. E90-C
No. 10 ;
pp. 1927-1935
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Technology toward Frontiers of New Market)
Category: Next-Generation Memory for SoC Keyword: DFM RAM, 2 cell/bit, low voltage scalability, screening test, SoC memory platform, |