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IEICE Trans

Keyword : DC linearity

Design for Testability That Reduces Linearity Testing Time of SAR ADCs
Tomohiko OGAWA Haruo KOBAYASHI Satoshi UEMORI Yohei TAN Satoshi ITO Nobukazu TAKAI Takahiro J. YAMAGUCHI Kiichi NIITSU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/06/01
Vol. E94-C  No. 6 ; pp. 1061-1064
Type of Manuscript:  BRIEF PAPER
Category: 
Keyword: 
SAR ADC, testing, DC linearity, design for testability, built-in self-test, 
 Summary | Full Text:PDF