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IEICE Trans

Keyword : CAD data

LSI Failure Analysis with CAD-Linked Electron Beam Test System and Its Cost Evaluation
Hiromu FUJIOKA Koji NAKAMAE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4 ; pp. 535-545
Type of Manuscript:  INVITED PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
LSI failure analysis, electron beam testing, CAD data, cost evaluation, 
 Summary | Full Text:PDF
Efficient Dynamic Fault Imaging by Fully Utilizing CAD Data in CAD-Linked Electron Beam Test System
Koji NAKAMAE Hirohisa TANAKA Hideharu KUBOTA Hiromu FUJITA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4 ; pp. 546-551
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
vacuum and beam technologies, electron beam testing, dynamic fault imaging, CAD data, image processing, 
 Summary | Full Text:PDF