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IEICE Trans

Keyword : Automatic Test Equipment

A Novel Pattern Run-Length Coding Method for Test Data Compression
Diancheng WU Yu LIU Hao ZHU Donghui WANG Chengpeng HAO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/09/01
Vol. E96-C  No. 9 ; pp. 1201-1204
Type of Manuscript:  BRIEF PAPER
Category: Integrated Electronics
Keyword: 
Automatic Test Equipment, test data compression, pattern run-length coding, X-assigning, 
 Summary | Full Text:PDF