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IEICE Trans

Keyword : output buffer circuit

Radiated Harmonics Characterization of CMOS Test Chip with On-Chip Decoupling Capacitance
Toshio SUDO 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2005/08/01
Vol. E88-B  No. 8 ; pp. 3195-3199
Type of Manuscript:  Special Section PAPER (Special Section of 2004 International Symposium on Electromagnetic Compatibility)
Category: Printed Circuit Boards
Keyword: 
radiated emission, on-chip decoupling capacitor, test chip, core circuit, output buffer circuit, simultaneous switching noise, 
 Summary | Full Text:PDF