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IEICE Trans

Keyword : external noise

Linear Equivalent Circuit of a Digital Gate for Characterization of Malfunction Mechanism
Naoki KAGAWA Osami WADA Ryuji KOGA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1997/11/25
Vol. E80-B  No. 11 ; pp. 1652-1653
Type of Manuscript:  Special Section LETTER (Special Issue on EMC Implications of Densely Mounted Electronic Devices)
Category: 
Keyword: 
digital circuit, malfunction, external noise, jitters, circuit resonance, CMOS logic IC, 
 Summary | Full Text:PDF