Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2018/12/01 Vol. E101-ANo. 12 ;
pp. 2262-2270 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: weighted fault coverage, critical area, critical area analysis, bridge fault, open fault,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2017/07/01 Vol. E100-ANo. 7 ;
pp. 1488-1495 Type of Manuscript: Special Section PAPER (Special Section on Design Methodologies for System on a Chip) Category: Keyword: weighted fault coverage, critical area, test cost reduction, test pattern reduction, bridge fault, open fault,