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IEICE Trans

Keyword : visual abnormalities

Fault Diagnosis Technique for Yield Enhancement of Logic LSI Using IDDQ
Masaru SANADA Hiromu FUJIOKA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2000/05/25
Vol. E83-A  No. 5 ; pp. 842-850
Type of Manuscript:  Special Section PAPER (Special Section on Reliability Theory and Its Applications)
Category: 
Keyword: 
IDDQ, visual abnormalities, logic LSI, fault diagnosis, physical damages, 
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