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IEICE Trans

Keyword : transistor-level circuits

Automatic Tracing of Transistor-Level Performance Faults with CAD-Linked Electron Beam Test System
Katsuyoshi MIURA Koji NAKAMAE Hiromu FUJIOKA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/03/25
Vol. E77-A  No. 3 ; pp. 539-545
Type of Manuscript:  PAPER
Category: Computer Aided Design (CAD)
Keyword: 
fault analysis, fault tracing, electron beam testing, performance fault, transistor-level circuits, 
 Summary | Full Text:PDF