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IEICE Trans

Keyword : timing characterization

Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability
Song BIAN Michihiro SHINTANI Masayuki HIROMOTO Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/07/01
Vol. E99-A  No. 7 ; pp. 1400-1409
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTI, reliability, static timing analysis, timing characterization, aging-aware timing library, 
 Summary | Full Text:PDF