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IEICE Trans

Keyword : testability analysis

Reply to the Comments on Originality of the Paper "The Integrated Scheduling and Allocation of High-Level Test Synthesis"
Tianruo YANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1999/12/25
Vol. E82-A  No. 12 ; pp. 2834-2835
Type of Manuscript:  LETTER
Category: VLSI Design Technology and CAD
Keyword: 
high-level test synthesis, scheduling and allocation, testability analysis, loop analysis, design transformations, 
 Summary | Full Text:PDF
Comments on the Originality of the Paper, "The Integrated Scheduling and Allocation of High-Level Test Synthesis"
Taewhan KIM 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1999/12/25
Vol. E82-A  No. 12 ; pp. 2833-2833
Type of Manuscript:  LETTER
Category: VLSI Design Technology and CAD
Keyword: 
high-level test synthesis, scheduling and allocation, testability analysis, loop analysis, design transformations, 
 Summary | Full Text:PDF
The Integrated Scheduling and Allocation of High-Level Test Synthesis
Tianruo YANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1999/01/25
Vol. E82-A  No. 1 ; pp. 145-158
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
high-level test synthesis, scheduling and allocation, testability analysis, loop analysis, design transformations, 
 Summary | Full Text:PDF
Register-Transfer Level Testability Analysis and Its Application to Design for Testability
Mizuki TAKAHASHI Ryoji SAKURAI Hiroaki NODA Takashi KAMBE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1998/12/25
Vol. E81-A  No. 12 ; pp. 2646-2654
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword: 
testability analysis, register transfer level, design for testability, 
 Summary | Full Text:PDF