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IEICE Trans

Keyword : test set generation

Using Satisfiability Solving for Pairwise Testing in the Presence of Constraints
Toru NANBA Tatsuhiro TSUCHIYA Tohru KIKUNO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2012/09/01
Vol. E95-A  No. 9 ; pp. 1501-1505
Type of Manuscript:  Special Section LETTER (Special Section on Software Reliability Engineering)
Category: 
Keyword: 
SAT, software testing, pairwise testing, test set generation, constraints, 
 Summary | Full Text:PDF