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IEICE Trans

Keyword : test pattern reduction

Reordering-Based Test Pattern Reduction Considering Critical Area-Aware Weighted Fault Coverage
Masayuki ARAI Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2017/07/01
Vol. E100-A  No. 7 ; pp. 1488-1495
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
weighted fault coverage, critical area, test cost reduction, test pattern reduction, bridge fault, open fault, 
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