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IEICE Trans

Keyword : test malfunction

Locating Hotspots Based on Switching Probability Calculation and Functional Analysis with Partial Truth Table
Yuusei OGATA Tomoya YAMASHITA Kohei MIYASE Shyue-Kung LU Xiaoqing WEN 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2026/09/01
Vol. E109-A  No. 9 ; pp. 1638-1648
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
at-speed testing, power consumption, IR-drop, transition delay test, test malfunction, probability of switching activity, functional analysis, 
 Summary | Full Text:PDF