Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1993/10/25
Vol. E76-A
No. 10 ;
pp. 1770-1774
Type of Manuscript:
Special Section LETTER (Special Section on VLSI Design and CAD Algorithms)
Category:
Keyword:
test generation for sequential circuitt, product machine traversal method, mixed breadth-first/depth-first traversal, partitioned image computation, |