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IEICE Trans

Keyword : stochastic intensity processes

Exponential Regression-Based Software Reliability Model and Its Computational Aspect
Shinya IKEMOTO Tadashi DOHI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2012/09/01
Vol. E95-A  No. 9 ; pp. 1461-1468
Type of Manuscript:  Special Section PAPER (Special Section on Software Reliability Engineering)
Category: 
Keyword: 
software reliability, exponential regression, stochastic intensity processes, software metrics, pseudo maximum likelihood method, approximation, 
 Summary | Full Text:PDF