Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2018/02/01
Vol. E101-A
No. 2 ;
pp. 410-424
Type of Manuscript:
Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category: Keyword: sub-ranging ADC, stochastic comparator, yield, probability density function, optimization, calibration, |