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Pruning-Based Trace Signal Selection Algorithm for Data Acquisition in Post-Silicon Validation
Kang ZHAO Jinian BIAN | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2012/06/01
Vol. E95-A
No. 6 ;
pp. 1030-1040
Type of Manuscript:
PAPER
Category: VLSI Design Technology and CAD
Keyword:
algorithm, silicon debug, state restoration, trace signal selection, | | | Summary | Full Text:PDF | |
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