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IEICE Trans

Keyword : safe-error attack

A Configurable On-Chip Glitchy-Clock Generator for Fault Injection Experiments
Sho ENDO Takeshi SUGAWARA Naofumi HOMMA Takafumi AOKI Akashi SATOH 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2012/01/01
Vol. E95-A  No. 1 ; pp. 263-266
Type of Manuscript:  Special Section LETTER (Special Section on Cryptography and Information Security)
Category: 
Keyword: 
faulty injection attacks, clock glitch, RSA, safe-error attack, 
 Summary | Full Text:PDF