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IEICE Trans

Keyword : quadrature sampling

Fast Surface Profiling by White-Light Interferometry Using Symmetric Spectral Optical Filter
Akira HIRABAYASHI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/02/01
Vol. E93-A  No. 2 ; pp. 542-549
Type of Manuscript:  PAPER
Category: Measurement Technology
Keyword: 
surface profiling, white-light interferometry, in-phase component, symmetric spectral distribution, quadrature sampling, 
 Summary | Full Text:PDF