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IEICE Trans

Keyword : pseudo Boolean optimization

A Multiple Target Seed Generation Method for Random Pattern Resistant Faults on Built-In Self-Test
Takanobu SONE Toshinori HOSOKAWA Masayoshi YOSHIMURA Masayuki ARAI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2026/03/01
Vol. E109-A  No. 3 ; pp. 604-613
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
built-in self-test, one-pass seed generation, pseudo Boolean optimization, multiple target seed generation, random pattern resistant faults, 
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