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IEICE Trans

Keyword : polynomial regression

A Development of the TFT-LCD Image Defect Inspection Method Based on Human Visual System
Jong-Hwan OH Byoung-Ju YUN Se-Yun KIM Kil-Houm PARK 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/06/01
Vol. E91-A  No. 6 ; pp. 1400-1407
Type of Manuscript:  Special Section PAPER (Special Section on Image Media Quality)
Category: 
Keyword: 
TFT-LCD (thin film transistor-liquid crystal display), inspection, polynomial regression, human visual system, contrast sensitivity function, 
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