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IEICE Trans

Keyword : orthonormal Wavelet transform

Interscale Stein's Unbiased Risk Estimate and Intrascale Feature Patches Distance Constraint for Image Denoising
Qieshi ZHANG Sei-ichiro KAMATA Alireza AHRARY 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/08/01
Vol. E93-A  No. 8 ; pp. 1434-1441
Type of Manuscript:  Special Section PAPER (Special Section on Signal Processing)
Category: Image
Keyword: 
image denoising, orthonormal Wavelet transform, Stein's unbiased risk estimate (SURE), feature patches distance constraint (FPDC), 
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