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IEICE Trans

Keyword : nucleus reaction

Soft-Error Resilient and Margin-Enhanced N-P Reversed 6T SRAM Bitcell
Shusuke YOSHIMOTO Hiroshi KAWAGUCHI Masahiko YOSHIMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/09/01
Vol. E97-A  No. 9 ; pp. 1945-1951
Type of Manuscript:  PAPER
Category: Reliability, Maintainability and Safety Analysis
Keyword: 
robust SRAM, soft error rate, neutron particle, single bit upset, multiple cell upset, nucleus reaction, 
 Summary | Full Text:PDF