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IEICE Trans

Keyword : logical masking

Error Propagation Analysis for Single Event Upset considering Masking Effects on Re-Convergent Path
Go MATSUKAWA Yuta KIMI Shuhei YOSHIDA Shintaro IZUMI Hiroshi KAWAGUCHI Masahiko YOSHIMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/06/01
Vol. E99-A  No. 6 ; pp. 1198-1205
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
single event effect, single event upset, soft error propagation, logical masking, temporal masking, 
 Summary | Full Text:PDF