Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/06/01
Vol. E87-A
No. 6 ;
pp. 1330-1337
Type of Manuscript:
Special Section PAPER (Special Section on Papers Selected from 2003 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2003))
Category: Keyword: lead open, CMOS LSI, supply current test, electric field, |