Maximum Likelihood Analysis of Masked Data in Competing Risks Models with an Environmental Stress Yoshimitsu NAGAI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2004/12/01 Vol. E87-ANo. 12 ;
pp. 3389-3396 Type of Manuscript: PAPER Category: Reliability, Maintainability and Safety Analysis Keyword: gamma distribution, inverse Gaussian distribution, masking probability, reliability analysis,