Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2011/12/01
Vol. E94-A
No. 12 ;
pp. 2669-2675
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-Level Synthesis and System-Level Design
Keyword:
soft error, hardened design, variability, test structure, shift register, |