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IEICE Trans

Keyword : functional test

Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature
Takahiro NAKAYAMA Masanori HASHIMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2019/07/01
Vol. E102-A  No. 7 ; pp. 914-917
Type of Manuscript:  Special Section LETTER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
hold violation, ultra-low temperature, functional test, delay characteristic, 
 Summary | Full Text:PDF
A DFT Controller for Instruction-Based Functional Test
Hong-Sik KIM Yong-Chun KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/08/01
Vol. E84-A  No. 8 ; pp. 2070-2072
Type of Manuscript:  LETTER
Category: VLSI Design Technology and CAD
Keyword: 
functional test, scan, 
 Summary | Full Text:PDF
A Practical Functional Test Using Flowchart for Production Testing of Microprocessor Based Sequence Controllers
Masaki HASHIZUME Takeomi TAMESADA Eiji TASAKA Toshihiro KAYAHARA Tomohisa YAMAZOE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/07/25
Vol. E76-D  No. 7 ; pp. 837-841
Type of Manuscript:  Special Section LETTER (Special Issue on VLSI Testing and Testable Design)
Category: 
Keyword: 
sequence controller, process flowchart, functional test, microprocessor based circuit, 
 Summary | Full Text:PDF