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IEICE Trans

Keyword : focus measure

A New Approach to 3-D Profilometry for the White Light Interferometric (WLI)
Seok-Moon RYOO Tae-Sun CHOI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/01/01
Vol. E84-A  No. 1 ; pp. 378-382
Type of Manuscript:  LETTER
Category: Image
Keyword: 
white-light interferometry, profilometry, focus measure, focus, signal processing, 
 Summary | Full Text:PDF
Accurate Shape from Focus Using Second Order Curved Search Windows
Joungil YUN Tae S. CHOI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2000/03/25
Vol. E83-A  No. 3 ; pp. 571-574
Type of Manuscript:  LETTER
Category: Computer Graphics
Keyword: 
CCD camera, focus, focus measure, Shape from Focus (SFF), Focused Image Surface (FIS), curved window, 
 Summary | Full Text:PDF