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IEICE Trans

Keyword : failure probability calculation

Efficient Aging-Aware Failure Probability Estimation Using Augmented Reliability and Subset Simulation
Hiromitsu AWANO Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2017/12/01
Vol. E100-A  No. 12 ; pp. 2807-2815
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
failure probability calculation, NBTI, Monte Carlo, subset simulation, augmented reliability, 
 Summary | Full Text:PDF
Efficient Aging-Aware SRAM Failure Probability Calculation via Particle Filter-Based Importance Sampling
Hiromitsu AWANO Masayuki HIROMOTO Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/07/01
Vol. E99-A  No. 7 ; pp. 1390-1399
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
SRAM cell yield, failure probability calculation, NBTI, importance sampling, particle filter, Monte Carlo method, 
 Summary | Full Text:PDF