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IEICE Trans

Keyword : double diffusion break

Standard Cell Structure and Diffusion Reordering for Block Area Reduction in Double Diffusion Break FinFET Process
Shinichi NISHIZAWA Shinji KIMURA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2025/06/01
Vol. E108-A  No. 6 ; pp. 798-805
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
standard cell, FinFET, double diffusion break, 
 Summary | Full Text:PDF