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IEICE Trans

Keyword : distinguishing sequence

Test Sequence Generation for Sequential Circuits with Distinguishing Sequences
Yoshinobu HIGAMI Seiji KAJIHARA Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1993/10/25
Vol. E76-A  No. 10 ; pp. 1730-1737
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
distinguishing sequence, stuck-at fault, sequential circuit, test sequence generation, design rechnique, 
 Summary | Full Text:PDF