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IEICE Trans

Keyword : delay characteristic

Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature
Takahiro NAKAYAMA Masanori HASHIMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2019/07/01
Vol. E102-A  No. 7 ; pp. 914-917
Type of Manuscript:  Special Section LETTER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
hold violation, ultra-low temperature, functional test, delay characteristic, 
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