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IEICE Trans

Keyword : defect pattern classification

Classification of Mixed-Type Defects in Wafer Bin Maps Utilizing the Quantum Approximate Optimization Algorithm
Qingqing YU Yinhui YU 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2026/01/01
Vol. E109-A  No. 1 ; pp. 26-34
Type of Manuscript:  PAPER
Category: Algorithms and Data Structures
Keyword: 
defect pattern classification, mixed-type defects, quantum approximate optimization algorithm, support vector machine, 
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