Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2008/12/01 Vol. E91-ANo. 12 ;
pp. 3531-3538 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Logic Synthesis, Test and Verification Keyword: power gating, multi-threshold CMOS (MTCMOS) technology, BDD, controlling value, leakage power reduction,