Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2011/12/01
Vol. E94-A
No. 12 ;
pp. 2571-2578
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verification
Keyword:
delay testing, design-for-testability, skewed-load test application, broad-side test application, partial skewed-load scan design, hybrid test application, |