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IEICE Trans

Keyword : boolean function manipulation

Compact Test Sequences for Scan-Based Sequential Circuits
Hiroyuki HIGUCHI Kiyoharu HAMAGUCHI Shuzo YAJIMA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1993/10/25
Vol. E76-A  No. 10 ; pp. 1676-1683
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
test generation, scan design, test application time, boolean function manipulation, 
 Summary | Full Text:PDF