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IEICE Trans

Keyword : aging test

A Single-Inverter-Based True Random Number Generator with On-Chip Clock-Tuning-Based Entropy Calibration Circuit
Xingyu WANG Ruilin ZHANG Hirofumi SHINOHARA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2024/01/01
Vol. E107-A  No. 1 ; pp. 105-113
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Systems)
Category: 
Keyword: 
entropy, hardware security, charge injection, true random number generator (TRNG), post-processing, NIST tests, aging test, 
 Summary | Full Text:PDF