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IEICE Trans

Keyword : accumulated maximum probability (AMP)

Novel Method of Interconnect Worstcase Establishment with Statistically-Based Approaches
Won-Young JUNG Hyungon KIM Yong-Ju KIM Jae-Kyung WEE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/04/01
Vol. E91-A  No. 4 ; pp. 1177-1184
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
process-induced variation, interconnect worstcase optimization, effective common geometry (ECG), accumulated maximum probability (AMP), non-normal distribution, 
 Summary | Full Text:PDF