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IEICE Trans

Keyword : accelerated testing

Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data
Zheng-Liang HUANG Fa-Xin YU Shu-Ting ZHANG Hao LUO Ping-Hui WANG Yao ZHENG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/09/01
Vol. E92-A  No. 9 ; pp. 2376-2379
Type of Manuscript:  LETTER
Category: Reliability, Maintainability and Safety Analysis
Keyword: 
MMICs, reliability, failure, accelerated testing, Weibull distribution, lognormal distribution, 
 Summary | Full Text:PDF