Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2026/05/01 Vol. E109-ANo. 5 ;
pp. 868-872 Type of Manuscript: Special Section LETTER (Special Section on Analog Circuit Techniques and Related Topics) Category: Keyword: circuit-level chips, Wiener process, degradation model, lifetime prediction,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1996/09/25 Vol. E79-ANo. 9 ;
pp. 1429-1432 Type of Manuscript: Special Section PAPER (Special Section on Information Theory and Its Applications) Category: Stochastic Process/Learning Keyword: wear models, first-passage times, Wiener process, Ornstein-Uhlenbeck process,