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IEICE Trans

Keyword : ResNet50

Deep Learning for Semiconductor Chip Quality Assessment
Yang LIU Xiaozhan LI Xuejun ZHANG Junqi YUAN Bozhen ZHANG Meiqin LIANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2026/06/01
Vol. E109-A  No. 6 ; pp. 1148-1156
Type of Manuscript:  PAPER
Category: Algorithms and Data Structures
Keyword: 
quality assessment, defect detection, semiconductor chips, ResNet50, deep learning, 
 Summary | Full Text:PDF