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IEICE Trans

Keyword : Lempel-Ziv complexity

A Randomness Test Based on T-Complexity
Kenji HAMANO Hirosuke YAMAMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/07/01
Vol. E93-A  No. 7 ; pp. 1346-1354
Type of Manuscript:  PAPER
Category: Cryptography and Information Security
Keyword: 
T-code, T-complexity, Lempel-Ziv complexity, NIST SP 800-22, NIST statistical test suite, multiplicative congruential generator, 
 Summary | Full Text:PDF