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IEICE Trans

Zian CHEN

A Low-Cost Training Method of ReRAM Inference Accelerator Chips for Binarized Neural Networks to Recover Accuracy Degradation due to Statistical Variabilities
Zian CHEN Takashi OHSAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2022/08/01
Vol. E105-C  No. 8  pp. 375-384
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
in-memory computing, deep neural networks (DNNs), binarized neural networks (BNNs), ReRAM, fabrication fluctuation, in-situ training, 
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