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IEICE Trans

Yusuke NAKAMURA

A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits
Yuta YAMATO Yusuke NAKAMURA Kohei MIYASE Xiaoqing WEN Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3  pp. 667-674
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Fault Diagnosis
Keyword: 
fault diagnosis, X-fault model, per-test, via, 
 Summary | Full Text:PDF