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IEICE Trans

Yukari YAMAUCHI

A Low Capture Power Test Generation Method Based on Capture Safe Test Vector Manipulation
Toshinori HOSOKAWA Atsushi HIRAI Yukari YAMAUCHI Masayuki ARAI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2017/09/01
Vol. E100-D  No. 9  pp. 2118-2125
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
low power, test generation, capture safe test vectors, test vector synthesis, unsafe faults, 
 Summary | Full Text:PDF
Interval and Paired Probabilities for Treating Uncertain Events
Yukari YAMAUCHI Masao MUKAIDONO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1999/05/25
Vol. E82-D  No. 5  pp. 955-961
Type of Manuscript:  Special Section PAPER (Special Issue on Multiple-Valued Logic and Its Applications)
Category: Probability and Kleene Algebra
Keyword: 
interval probability, 
 Summary | Full Text:PDF