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IEICE Trans

Yuji TAKAHASHI

Two-Dimensional Cyclic Bias Device Simulator and Its Application to GaAs HJFET Pulse Pattern Effect Analysis
Yuji TAKAHASHI Kazuaki KUNIHIRO Yasuo OHNO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/25
Vol. E82-C  No. 6  pp. 917-923
Type of Manuscript:  Special Section PAPER (Special Issue on TCAD for Semiconductor Industries)
Category: 
Keyword: 
device simulation, cyclic bias simulator, pulse pattern effect, deep level, GaAs HJFET, 
 Summary | Full Text:PDF