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IEICE Trans

Yuichi NARITA

Analysis of Fault Detection Probability of Random Access Memories in Applying Random Patterns
Hideo TAMAMOTO Tatsumi OHTAKA Yuichi NARITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1991/11/25
Vol. E74-D  No. 11  pp. 3910-3920
Type of Manuscript:  LETTER
Category: Fault Tolerant Computing
Keyword: 
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