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IEICE Trans

Yue HAO

VLSI Yield Optimization Based on the Redundancy at the Sub-Processing-Element Level
Tianxu ZHAO Yue HAO Yong-Chang JIAO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2001/11/01
Vol. E84-D  No. 11  pp. 1471-1475
Type of Manuscript:  Special Section PAPER (Special Issue on Function Integrated Information Systems)
Category: 
Keyword: 
sub-processing-element level redundancy, genetic algorithm, average defect density, 
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